October 20, 2018
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XRM Workshop: Approaches for the Next Generation Sources


There is a worldwide effort in developing next-generation x-ray sources, including diffraction-limited storage rings, high repetition rate free electron lasers, and high harmonic gain laboratory sources. The prospective gains are revolutionary, rather than incremental, so we must think beyond a business-as-usual approach to x-ray microscopy. This workshop will provide a venue to discuss new ideas and approaches for the new sources. We especially encourage speculative ideas, which might not otherwise be proven enough to serve as contributions to the XRM2018 conference. The scope includes new ideas, instrumentation, and computational methods. If there is sufficient interest, contributions will be collected for a special issue of a refereed journal such as Ultramicroscopy, or Microscopy and Microanalysis.

Possible topics are listed below, but this is not an exclusive list. That is, topics and contributions that are not listed below but that fit the spirit of the workshop are welcome!

  • Novel x-ray source configurations, such as low-K undulators with no monochromator for high brightness with low power loading.
  • Novel imaging methods, such as ghost imaging
  • Non-standard data collection schemes, such as randomized or Lissajous curve scanning, or scanning of the electron beam in the storage ring.
  • New specimen conditions, such as acoustical levitation, or novel approaches to cryo microscopy or¬†in operando¬†studies.
  • Novel data collection and analysis capabilities matched to the anticipated data rates of next-generation x-ray sources.
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